Title:
DETERIORATION DETERMINATION DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/014072
Kind Code:
A1
Abstract:
Provided is a deterioration determination device capable of more appropriately determining element deterioration. A deterioration determination device (1) determines whether each of a first switch (33A) and a fuse (F) provided in a power path (11) that is a path for transmitting power from a power supply unit (10) to a load is in a deteriorated state or not. The power path (11) has a positive electrode-side power line (17) and a negative electrode-side power line (20). The first switch (33A) and the fuse (F) are provided in the negative electrode-side power line (20). The deterioration determination device (1) comprises: a first potential detection unit (39A) that detects a first potential on one end side of the first switch (33A) and a second potential on the other end side; a second potential detection unit (39B) that detects a first potential on one end side of the fuse (F) and a second potential on the other end side; and a control unit (15) that, on the basis of a potential difference (V1, V2) between the first potential and the second potential, determines whether each of the first switch (33A) and the fuse (F) is in a deteriorated state or not.
Inventors:
OKAMOTO TAKAHIRO (JP)
SHIMODA HIROKI (JP)
YANAGIDA TAIJI (JP)
HASHIKURA MANABU (JP)
UCHIDA KOKI (JP)
KAWAKAMI TAKAFUMI (JP)
SHIMODA HIROKI (JP)
YANAGIDA TAIJI (JP)
HASHIKURA MANABU (JP)
UCHIDA KOKI (JP)
KAWAKAMI TAKAFUMI (JP)
Application Number:
PCT/JP2023/014615
Publication Date:
January 18, 2024
Filing Date:
April 10, 2023
Export Citation:
Assignee:
AUTONETWORKS TECHNOLOGIES LTD (JP)
SUMITOMO WIRING SYSTEMS (JP)
SUMITOMO ELECTRIC INDUSTRIES (JP)
SUMITOMO WIRING SYSTEMS (JP)
SUMITOMO ELECTRIC INDUSTRIES (JP)
International Classes:
H01H1/00; H01H9/54; H01H47/00
Foreign References:
JP2006216516A | 2006-08-17 | |||
US20210402938A1 | 2021-12-30 | |||
JP2020137334A | 2020-08-31 | |||
JP2013188088A | 2013-09-19 |
Attorney, Agent or Firm:
GRANDOM PATENT LAW FIRM (JP)
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