CONDUCTIVE PARTICLES FOR ELECTRICAL TESTING, TESTING CONNECTOR, AND CONDUCTIVE PARTICLE MANUFACTURING METHOD

WIPO Patent Application WO/2024/014667

A1

The present invention relates to conductive particles, and to conductive particles which are used for a testing connector disposed between a test device and a testing device so as to electrically connect a terminal of the test device and a pad of the testing device, are distributed as a plurality in an elastic insulating material so as to be in contact with each other when in contact with the test device, thereby forming a conductive path for electrical signal transmission, and comprise: a body part, which has a flat lower surface disposed on the bottom surface thereof, has a width that decreases upward from the lower surface thereof, and is made of a conductive material; and a protrusion part, which protrudes downward from the lower surface of the body part, is integrally connected to the body part, has a width that is narrower than the bottom surface of the body part, and is made of a conductive material, wherein the body part has a curved part that becomes rounded from the bottom surface toward the top thereof.

KIM HYUNG JUN (KR)
YOO EUN JI (KR)
KIM JONG WON (KR)
CHUNG YOUNG BAE (KR)

PCT/KR2023/005369

January 18, 2024

April 20, 2023

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ISC CO LTD (KR)

G01R1/04; G01R3/00; G01R31/28

KR20220023438A	2022-03-02
KR102204910B1	2021-01-19
KR101739536B1	2017-05-24
KR101339166B1	2013-12-09
KR20200039401A	2020-04-16
KR20220016863A	2022-02-10

Y.P.LEE, MOCK & PARTNERS (KR)

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