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Title:
CALIBRATION DEVICE, RAMAN SPECTROSCOPY MEASUREMENT DEVICE, AND WAVE NUMBER CALIBRATION METHOD
Document Type and Number:
WIPO Patent Application WO/2024/085056
Kind Code:
A1
Abstract:
A spectroscopy measurement device according to the present embodiment comprises: a lamp light source (160) for generating lamp light having a plurality of emission lines; a plurality of inorganic materials; an objective lens (50) on which the lamp light and Raman scattered light from the plurality of inorganic materials impinge; a spectrometer (60) that spectrally detects the lamp light and the Raman scattered light from the objective lens (50); and a processing unit (70) that calculates a calibration wavelength axis of the spectrometer (60) on the basis of the wavelengths of the plurality of emission lines, calculates the incident wavelength of the laser light on the basis of the Raman bands of the Raman scattered light on the calibration wavelength axis, and converts the calibration wavelength axis to a wavenumber axis using the incident wavelength.

Inventors:
KUMAMOTO YASUAKI (JP)
FUJITA KATSUMASA (JP)
Application Number:
PCT/JP2023/036999
Publication Date:
April 25, 2024
Filing Date:
October 12, 2023
Export Citation:
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Assignee:
OSAKA UNIV (JP)
International Classes:
G01J3/02; G01J3/44; G01N21/65
Attorney, Agent or Firm:
IEIRI Takeshi (JP)
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