Title:
AUTONOMOUS INSPECTION METHOD AND APPARATUS FOR INSPECTION DEVICE, AND ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/088016
Kind Code:
A1
Abstract:
The present disclosure provides an autonomous inspection method for an inspection device. The autonomous inspection method comprises the following steps: acquiring position information of the inspection device; detecting whether an object to be inspected is present in an inspection region; when the object is present in the inspection region, predetermining, in combination with the position information of the inspection device, the orientation of the object relative to the inspection device; according to the predetermined orientation, enabling the inspection device to move in a first direction, and checking whether the object is present in a second direction; and when the object is detected in the second direction, enabling the inspection device to move in the second direction, and inspecting the object.
Inventors:
LI JIAN (CN)
WANG YONGMING (CN)
YUAN XIN (CN)
ZHU XINBO (CN)
RAN ZHANSEN (CN)
NI XIULIN (CN)
WANG YONGMING (CN)
YUAN XIN (CN)
ZHU XINBO (CN)
RAN ZHANSEN (CN)
NI XIULIN (CN)
Application Number:
PCT/CN2023/122437
Publication Date:
May 02, 2024
Filing Date:
September 28, 2023
Export Citation:
Assignee:
NUCTECH CO LTD (CN)
International Classes:
G01V9/00; G01S17/04
Domestic Patent References:
| WO2022121460A1 | 2022-06-16 |
Foreign References:
| CN116224462A | 2023-06-06 | |||
| CN113597587A | 2021-11-02 | |||
| CN108460314A | 2018-08-28 | |||
| JP2021148698A | 2021-09-27 | |||
| CN111882694A | 2020-11-03 |
Attorney, Agent or Firm:
CHINA SCIENCE PATENT & TRADEMARK AGENT LTD. (CN)
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