Title:
ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND ELECTRONIC DEVICE MANUFACTURING METHOD
Document Type and Number:
WIPO Patent Application WO/2024/024669
Kind Code:
A1
Abstract:
The present invention provides: an actinic ray-sensitive or radiation-sensitive resin composition containing a resin (A) the polarity of which is increased by action of acid and a specific compound (B) represented by a general formula (B-1) described in the specification; an actinic ray-sensitive or radiation-sensitive film formed from the actinic ray-sensitive or radiation-sensitive resin composition; a pattern forming method; and an electronic device manufacturing method.
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Inventors:
YAMAGUCHI SHUHEI (JP)
MIYOSHI TARO (JP)
TAKAHASHI KOTARO (JP)
MIYOSHI TARO (JP)
TAKAHASHI KOTARO (JP)
Application Number:
PCT/JP2023/026778
Publication Date:
February 01, 2024
Filing Date:
July 21, 2023
Export Citation:
Assignee:
FUJIFILM CORP (JP)
International Classes:
G03F7/004; C08F12/02; C08F20/12; G03F7/039; G03F7/20
Domestic Patent References:
WO2021246448A1 | 2021-12-09 |
Foreign References:
JP2021107850A | 2021-07-29 | |||
JP2021076784A | 2021-05-20 | |||
JP2020148901A | 2020-09-17 |
Attorney, Agent or Firm:
KOH-EI, P.C. (JP)
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