Title:
ABNORMALITY DETECTING DEVICE, ABNORMALITY DETECTING METHOD, AND ABNORMALITY DETECTING PROGRAM
Document Type and Number:
WIPO Patent Application WO/2021/014670
Kind Code:
A1
Abstract:
Provided is a technique with which it is possible for an abnormality to be appropriately determined. An abnormality in a device of interest is detected on the basis of the distance from a predetermined reference curve to a point represented by a first index value and a second index value in a two-dimensional plane having the first index value and the second index value as axes.
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Inventors:
TAKEDA KAZUHIRO (JP)
SAKASHITA SHOTA (JP)
HASHIMOTO NAOYA (JP)
SAKASHITA SHOTA (JP)
HASHIMOTO NAOYA (JP)
Application Number:
PCT/JP2020/008498
Publication Date:
January 28, 2021
Filing Date:
February 28, 2020
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
B30B15/28; G05B23/02
Foreign References:
| JP2019104039A | 2019-06-27 | |||
| JP2019003389A | 2019-01-10 | |||
| JP2016209885A | 2016-12-15 | |||
| JP2006158031A | 2006-06-15 | |||
| JP2016209885A | 2016-12-15 | |||
| JP2006158031A | 2006-06-15 |
Other References:
See also references of EP 4005785A4
Attorney, Agent or Firm:
MURAKAMI, Takashi (JP)
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