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WO/2005/101036A1 |
Opposite ends of a transmission line (12) having known electric characteristics per unit length are connected, respectively, with measuring ports of a network analyzer (20), the transmission line (12) is shunted with short chips (10) at ...
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WO/2005/099111A1 |
The present invention provides a method, system, and processor instructions for calibrating a modular wide-range microwave communication system. The system includes a first radio module (920) including a calibration memory and radio circ...
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WO/2005/091869A2 |
A method and apparatus of temperature compensation for an integrated circuit using on-chip circuits, sensors, and a calibration algorithm. The chip includes an on-chip reference circuit (12), an on-chip sensor (26) measuring a parameter ...
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WO/2005/086630A2 |
A four-port junction is substituted for a six-port junction in a frequency domain reflectometer, which reduces the parts count and therefore cost and size of the reflectometer while improving reliability. The frequency domain reflectomet...
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WO/2005/085883A2 |
Apparatus for generating an output dependent upon the impedance or at least one component of the impedance of a device (20) comprises a load component having a known impedance (21) or component thereof for connection in series with said ...
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WO/2005/085881A1 |
The invention relates to an energy meter system with two inputs (1, 2) to which signals are supplied that depend on an electrical voltage (V) and an electric current (I). These signals are digitized and interlinked in A/D converters (3, ...
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WO/2005/085880A2 |
The present invention relates to the field of shunt based electrical power meter. Said meter (10) comprises Live In and Live Out terminals LI and LO adapted to be series connected in the live wire of the electrical power distribution cir...
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WO/2005/080999A1 |
The error of a measuring system can be corrected by acquiring the phase of transmission tracking. A network analyzer comprises a measuring system error factor recording section (80) and an error factor acquiring section (90). The measuri...
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WO/2005/069943A2 |
A calibration system for calibrating frequency domain reflectometer in the field by using the scattering parameters of the multi-port junction determined at the factory (101) and changing the offset and gain terms used in generating a co...
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WO/2005/069883A2 |
A multi-port junction is used in combination with an Inverse Fourier Transform to detect distance to fault in an RF transmission line or waveguide without the use of heterodyne down-conversion circuits. To provide an ultra-wide bandwidth...
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WO/2005/066643A1 |
The invention relates to an energy metering system comprising two inputs (1, 2) to which electric voltage (V) and current (I) dependent signals are transmitted. Said signals are digitised in analog-to-digital converters and linked to eac...
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WO/2005/061990A1 |
There is provided an azimuth measurement device capable of not obtaining erroneous offset information when a change is made while maintaining a posture in a particular direction and capable of obtaining corresponding offset information w...
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WO/2005/052771A1 |
Systems and techniques are disclosed relating to calibrating an integrated circuit to an electronic component in order to compensate for process, voltage on temperature variations. The systems and techniques include an integrated circuit...
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WO/2005/043176A2 |
A calibration structure for probing devices.
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WO/2005/040985A2 |
A method for obtaining at least one calibration filter for a Mass Spectrometry (MS) instrument system. Measured isotope peak cluster data in a mass spectral range is obtained for a given calibration standard. Relative isotope abundances ...
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WO/2005/029102A1 |
It is possible to perform calibration of the measurement system of a circuit parameter of a DUT (device under test) by reducing the number of attachments and detachments of a calibration kit. An error factor acquisition device includes: ...
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WO/2005/026759A1 |
A testing apparatus for testing devices comprises a timing generator part for generating a timing signal indicative of the timing at which to apply a test signal; a plurality of timing delay parts for delaying the timing signals; a plura...
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WO/2005/017542A2 |
In performing testing on Automatic Test Equipment (ATE) it is a challenge to accurately generate and measure RF (radio frequency) power. In an example embodiment, in a test apparatus (100) used for measuring the input and output characte...
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WO/2005/012933A1 |
The invention relates to a test device comprising a precision signal generator (201) which is used to generate a test signal and is connected, by means of a connection line (409), to an input contact (211; 221; 231) used for connection t...
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WO/2004/099798A2 |
An electric current measurement device, comprises a housing defining a first open end and a second open end. A first sealing means has an aperture and has an overall geometrical configuration corresponding to the overall geometrical conf...
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WO/2004/092754A1 |
A system and method for calibration of a commercial semiconductor test system (tester). The system receives a synchronization signal from the tester and detects light emission from a device under test (DUT). The system then compares the ...
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WO/2004/086071A1 |
A test apparatus for testing electric devices, comprising a test module for sending/receiving test signals to/from electric devices; a test head having a plurality of TH slots for removably holding the test module; a diagnosis module for...
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WO/2004/061853A2 |
A method of addressing a memory device on a memory module includes determining whether a command has been issued to the memory module. An evaluation state is entered if the command has been issued. While in the evaluation state, it is de...
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WO/2004/049564A1 |
It is possible to apply a correct power to a load even when the output impedance and the load impedance of the signal source are different from the characteristic impedance of the transmission line. The power applied to a load (2) can be...
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WO/2004/042415A1 |
The aim of the invention is to measure the wavelength quantities of a multiport test object by means of a multiport network analyzer, for which error correction values are determined in a preceding calibrating method. To this end, the in...
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WO/2004/028003A2 |
A system (10) is provided herein for monitoring the harmonic content of the FR signal delivered to an RF powered device (13). The system comprises (a) a voltage transducer (16) adapted to sample the voltage of the RF signal and to output...
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WO/2004/021454A2 |
The invention relates to a method for adjusting a wavelength-dependent output signal from a light-sensitive integrated circuit (1), whereby the output signal from the integrated circuit is measured at various measured wavelengths (Lambda...
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WO/2004/010491A1 |
A plurality of channel areas corresponding to respective channels (14’) (a group of probes) of a probe card (3) are arranged in a matrix and displayed on a display section (45). Among these, a plurality of channel areas corresponding t...
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WO/2004/005841A1 |
A method of calibrating a gauge in particular for the measurment of film thickness, uses a calibration variable to compensate for short term changes in probe tip condition, instead of a constant value. A calibration constant is based onl...
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WO/2004/003585A1 |
The invention refers to a magnetic calibration device comprising a mounting means designed to support at least one magnetic sensor card being detachably attached and comprising at least one magnetic sensor, in particular in form of a Hal...
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WO/2004/001437A1 |
Circuit arrangement for simultaneous testing of electricity meters with inter connected current and voltage measurement circuits comprising a plurality of said meters all having voltage terminals associated with the same phase connected ...
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WO/2003/098255A1 |
The accuracy of a method for calibrating an N terminal microwave measurement network (10), the method comprising the measurement of network parameter values of a load device (43), depends on the knowledge of the parasitic impedance of th...
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WO/2003/088349A1 |
A signal detection contactor has a contactor body and a plurality of coaxial bodies. The coaxial bodies have a core wire, which contacts with probes of a probe apparatus to receive signals sent from a tester and which is used to correct ...
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WO/2003/083907A2 |
The calibration reference standard of a determination apparatus [300] is determined and the error model is found and the determination results from which the effects of systematic error have been removed are displayed. If the operator is...
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WO/2003/081263A1 |
The invention relates to a circuit arrangement and to a method with which an electric circuit can be tested for a correct functionality. To this end, a first and a second current sensor are provided in the electric circuit. During a test...
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WO/2003/076956A2 |
The invention relates to a method for measuring the residual system directivity and/or the residual system port impedance match of a measuring port (M) of a system-calibrated vector network analyser (N). According to said method, an outp...
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WO/2003/073317A1 |
A digital signal processing system (1) capable of compensating for frequency response variations (5) and generating a response characteristic (8) that complies with a provided specification (14). The system automatically generates digita...
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WO/2003/073222A2 |
A method and apparatus for calibrating an oscilloscope and storing the calibration results for further use. Accordingly, an oscilloscope is provided with a calibration cache database for storing various calibration curves and their assoc...
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WO/2003/071298A1 |
Methods, apparatus and data structures useful in correcting PICA image data are described. An exemplary method comprises acquiring optical image data of a target having identifiable optical-image features, acquiring PICA image data of th...
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WO/2003/065063A2 |
PICA probe system methods and apparatus are described, including methods and apparatus for calibrating an event timer having a coarse measurement capability in which time intervals defined by clock boundaries are counted and a fine measu...
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WO/2003/056350A1 |
A method for calibrating voltage sensors in a switchboard, using a communication bus which comprises the following steps: i. performing a measurement using a first voltage sensor; ii. transmitting an information derived from said measure...
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WO/2003/052447A1 |
The invention relates to a device for measuring the consumption of electrical energy, which determines a current output signal from voltage and current signals (u, i) that can be supplied to inputs (2, 3) of the circuit, said output sign...
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WO/2003/040852A2 |
The invention relates to a circuit (100) for producing an output signal (116) that depends on a physical useful variable (108). Said circuit comprises a device (106) for detecting the physical useful variable (108), said device (106) bei...
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WO/2003/027694A2 |
Method and apparatus for in-circuit socket testing that includes a module, a printed circuit board, and a test fixture. The module contains two or more switching devices. The module is electrically attachable to a socket. The printed cir...
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WO/2003/025596A2 |
An on-board self test system for an electrical power monitoring device includes a test signal circuit in an electronic circuit of the monitoring device, and responsive to a programmable test input signal for producing an analog signal si...
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WO/2003/021279A1 |
An electronic meter includes a sensing circuit for sensing voltage and current values of a waveform, an analog-to-digital converter for converting the sensed voltage and current values to digital voltage and current values, a digital fil...
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WO/2003/021277A2 |
A power supply circuit is disclosed for use with a semiconductor tester to power a device-under-test. The power supply includes power generation circuitry disposed in the tester to generate power for the device-under-test. Load circuitry...
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WO/2003/019222A2 |
A watthour meter testing device for testing watthour meters is provided that includes a measuring device (40), a switch (160), a transmitter and a receiver. The measuring device is in communication with the power measured by the watthour...
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WO/2003/014755A1 |
A measuring device (10) for measuring the characteristics of probe cards, comprising load cells (11) placed on a main chuck (21) and detecting loads from the probe cards (26) and displacement sensors (13) for detecting the absolute displ...
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WO2002015109A9 |
An instrument or process calibrator (10) includes a housing, traceable, controllable calibration source in the housing, the calibration source including memory for storing identifying information about the calibration source, a data conn...
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